The probes on the Probe Card can be brought into contact with the pads on a chip to enable electrical signal input and output, thereby assessing the chip's electrical performance parameters.
Product Features
Available in various probe counts, sizes, and a wide range of probe materials;
Flexible needle arrangement, supporting both single-layer and multi-layer configurations;
Easy maintenance with replaceable individual probes;
Suitable for testing various types of optoelectronic chips.
